semiconductor fuse 20-100a, 700 volts bif document 35785291 size 22 ? 58 10 1 2 2468 2 10 2 2468 10 3 2 4 6 2 6 4 2 6 4 2 6 4 2 6 4 2 6 4 6 4 2 6 2 4 10 1 10 0 10 ? 10 ? 10 ? 10 ? 10 2 10 3 10 4 prospective current in amperes rms virtual pre-arcing time in seconds fwp-20a22f fwp-25a22f fwp-32a22f fwp-40a22f fwp-50a22f fwp-63a22f fwp-80a22f FWP-100A22F pre-arcing time-current characteristic curves fwp 20a22f-100a22f approved: nn rev. date: sept-97 page 1 of 2 pub. date: jan-98 bussmann p.o. box 14460 st. louis, mo 63178-4460 u.s.a. phone: 636-394-2877 fax: 800-544-2570 int? fax: 636-527-1413 bussmann u.k. burton-on-the-wolds leicestershire le12 5th england phone: 44-1509-882737 fax: 44-1509-882786 bussmann denmark 5 literbuen dk-2740 skovlunde copenhagen, denmark phone: 45-4485-0900 fax: 45-4485-0901 bussmann reserves the right without notice to change design and/or discontinue distribution of this product. 1-17-01 sb00233
semiconductor fuse 20-100a, 700 volts bif document 35785291 size 22 ? 58 10 4 prospective short-circuit current symmetrical rms peak let-through current 2 6 4 2 6 4 246 246 2 46 10 2 10 3 10 2 10 3 10 4 10 5 fwp-20a22f fwp-25a22f fwp-32a22f fwp-40a22f fwp-50a22f fwp-63a22f fwp-80a22f FWP-100A22F 2 peak let-through cut-off current characteristic curves fwp 20a22f-100a22f approved: nn rev. date: sept-97 page 2 of 2 pub. date: jan-98 the only controlled copy of this bif document is the electronic read-only version located on the bussmann network drive. all ot her copies of this bif document are by definition uncontrolled. this bulletin is intended to clearly present comprehensive product data and provide technical information that wi ll help the end user with design applications. bussmann reserves the right, without notice, to change design or construction of any products and to discontinue or limit distribution o f any products. bussmann also reserves the right to change or update, without notice, any technical information contained in this bulletin. once a product has been selected, it sh ould be tested by the user in all possible applications. 1-17-01 sb00233
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